ANTARES® uses cryogenic aerosol technology to safely remove nanoscale particles from device surfaces. Unlike traditional aqueous technologies, this all-dry process reduces defects without damaging the wafer surface, even on copper and porous low-k films. ANTARES is a highly effective, yield increasing defect removal tool that can be used for a variety of applications including via etch, film deposition and inline probe testing.

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Benefits

    • Cleans surfaces that are water or chemically sensitive
    • Prevents metal attack and corrosion
    • Will not etch or alter film properties
    • Ideal for hydrophobic surfaces/structures sensitive to chemicals and/or megasonic energy
    • Higher particle removal efficiencies than water jet scrubber method
    • Significant yield improvement

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